CVE-2018-13888
- State
- Published
- Severity
- Not scored
- Published
- Feb 11, 2019
- Updated
- Aug 5, 2024
- Reserved
- Jul 11, 2018
Description
There is potential for memory corruption in the RIL daemon due to de reference of memory outside the allocated array length in RIL in Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in versions MDM9206, MDM9607, MDM9635M, MDM9650, MSM8909W, SD 210/SD 212/SD 205, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 625, SD 636, SD 650/52, SD 675, SD 712 / SD 710 / SD 670, SD 820A, SD 835, SD 845 / SD 850, SD 855, SDM439, SDM630, SDM660, ZZ_QCS605.
Scores
The record has no CVSS score.
Weaknesses
The record names no weakness.
Affected Products
| Product | Versions |
|---|---|
Snapdragon Auto, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon WearablesQualcomm, Inc. |
|
References
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